Label free ultra-sensitive imaging with sub-diffraction spatial resolution
Date
2019-07-09Author
Alexandrov, Sergey
Das, Nandan
McGrath, James
Owens, Peter
Sheppard, Colin J. R.
Boccafoschi, Francesca
Giannini, Cinzia
Sibillano, Teresa
Subhash, Hrebesh
Leahy, Martin
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Alexandrov, Sergey, Das, Nandan, McGrath, James, Owens, Peter, Sheppard, Colin J. R., Boccafoschi, Francesca, Giannini, Cinzia, Sibillano, Teresa, Subhash, Hrebesh, Leahy, Martin. (2019). Label free ultra-sensitive imaging with sub-diffraction spatial resolution. Paper presented at the 21st International Conference on Transparent Optical Networks, ICTON’2019, Angers, France, 09-13 July.
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Abstract
In this paper, we show a new way to break the resolution limit and dramatically improve sensitivity to structural
changes. To realize it we developed a novel label free contrast mechanism, based on the spectral encoding of
spatial frequency (SESF) approach. The super-resolution SESF (srSESF) microscopy is based on reconstruction
of the axial spatial frequency (period) profiles for each image point and comparison of these profiles to form
super-resolution image. As a result, the information content of images is dramatically improved in comparison
with conventional microscopy. Numerical simulation and experiments demonstrate significant improvement in
sensitivity and resolution.