Pattern evolution in bending dielectric-elastomeric bilayers
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Su, Yipin, Wu, Bin, Chen, Weiqiu, & Destrade, Michel. (2020). Pattern evolution in bending dielectric-elastomeric bilayers. Journal of the Mechanics and Physics of Solids, 136, doi:https://doi.org/10.1016/j.jmps.2019.07.013
We propose theoretical and numerical analyses of smart bending deformation of a dielectric-elastic bilayer in response to a voltage, based on the nonlinear theory of electro-elasticity and the associated linearized incremental field theory. We reveal that the mechanism allowing the bending angle of the bilayer can be tuned by adjusting the applied voltage. Furthermore, we investigate how much the bilayer can be bent before it loses its stability by buckling when one of its faces is under too much compression. We find that the physical properties of the two layers must be selected to be of the same order of magnitude to obtain a consequent bending without encountering buckling. If required, the wrinkles can be designed to appear on either the inner or the outer bent surface of the buckled bilayer. We validate the results through comparison with those of the classical elastic problem. (C) 2019 Elsevier Ltd. All rights reserved.